Transitions weight-based sum code for the digital computing devices synthesis

D.V. Efanov, D. Sc. (Tech.) 

Federal State Autonomous Educational Institution of Higher Education
“Russian University of Transport”
Russian Federation, 127994, Moscow, Obraztsova str., build. 9/9
contact phone number (+7) (911) 7092164, e-mail: TrES-4b@yandex.ru

Èlektron. model. 2021, 43(6):61-75

https://doi.org/10.15407/emodel.43.06.061

ABSTRACT

A method for constructing a family of sum codes is described based on weighting the transitions between groups of bits in the data vector. In this case, weights are used that are powers of the number 2. This makes it possible to obtain a code with check bits described by linear functions. The proposed weight-based sum code makes it possible to synthesize self-checking devices based on the standard elements and optimization methods of the logical device’s structures. A standard structure of a device with a concurrent error-detection (CED) circuit based on transitions weight-based sum codes between bits groups in the data vector is presented. The standard structure advantage lies in the possibility of synthesizing CED circuits with technical implementation reduced complexity by using codes with check bits numbers that are much smaller than the data bits numbers. Self-checking devices synthesized using the described codes in some cases may turn out to be less redundant than when using the standard duplication structure. The structure disadvantage is the need to consider the restrictions on the multiplicity of errors arising at the outputs of the diagnostic objects. This limitation increases with a decrease in the number of check bits. Despite this, in many cases, the use of a standard structure based on transitions weight-based sum code between groups of digits in the data vector makes it possible to synthesize self-checking digital devices. Using a standard structure for organizing a CED circuit allows going to implement of fault-tolerant digital devices according to standard structures, one of which is given in this article.

KEYWORDS

self-checking built-in control circuit, checking of calculations, transitions weight-based sum code, detection of errors in the data vector, standard CED circuit structure, standard fault-tolerant device structure.

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